缺陷(xian)類方(fang)法主要(yao)包括：普通缺陷(xian)和字符缺陷(xian)。
普通缺(que)(que)陷(xian)主(zhu)要指區(qu)域內(nei)或區(qu)域邊(bian)緣上缺(que)(que)陷(xian)檢測，字符缺(que)(que)陷(xian)主(zhu)要指各(ge)類字符印刷(shua)缺(que)(que)陷(xian)檢測。
相關的功能有：固定灰度(du)(du)、經典灰度(du)(du)、圓毛刺檢(jian)(jian)(jian)(jian)(jian)測(ce)、輪(lun)廓缺陷檢(jian)(jian)(jian)(jian)(jian)測(ce)、字符檢(jian)(jian)(jian)(jian)(jian)測(ce)B、灰度(du)(du)差分(fen)、分(fen)區固定灰度(du)(du)污(wu)漬(zi)(zi)檢(jian)(jian)(jian)(jian)(jian)測(ce)、固定灰度(du)(du)環(huan)形ROI、經典灰度(du)(du)污(wu)漬(zi)(zi)環(huan)形ROI 、局部二(er)值化污(wu)漬(zi)(zi)檢(jian)(jian)(jian)(jian)(jian)測(ce)、復(fu)雜表面劃痕檢(jian)(jian)(jian)(jian)(jian)測(ce)、魯棒(bang)直線輪(lun)廓缺陷檢(jian)(jian)(jian)(jian)(jian)測(ce)、多邊形固定灰度(du)(du)污(wu)漬(zi)(zi)檢(jian)(jian)(jian)(jian)(jian)測(ce)、多邊形經典灰度(du)(du)污(wu)漬(zi)(zi)檢(jian)(jian)(jian)(jian)(jian)測(ce)、非印字表面檢(jian)(jian)(jian)(jian)(jian)測(ce) 、分(fen)類局部二(er)值化污(wu)漬(zi)(zi)檢(jian)(jian)(jian)(jian)(jian)測(ce) |
